Boğaziçi CT3
Hizmetler
Device Name / Brand / Model
• Name: Scanning Electron Microscope (SEM) – ESEM / STEM Capable
• Brand: Thermo Scientific
• Model: Quattro S SEM
Overview
The Thermo Scientific Quattro S SEM is an advanced scanning electron microscope system that enables high-resolution surface characterization of conductive and non-conductive materials at the micro- and nanoscale. Using an electron beam, it allows detailed analysis of surface topography, morphology, chemical composition, and phase distribution in multiphase structures. With ESEM and STEM modes, it also supports analysis under environmental conditions and in liquid/wet sample environments.
Purpose / Output
• High-resolution imaging of surface topography and morphology at micro/nanoscale
• Chemical composition analysis and elemental mapping (EDS)
• Elemental contrast and phase distribution analysis in multiphase structures
• Imaging of non-conductive samples without coating (ESEM)
• Wet samples and nanoparticle characterization (STEM / WET-STEM)
Application Areas
• Surface morphology and topographic analyses
• Elemental analysis and mapping (EDS)
• Multiphase structures and elemental contrast
• Imaging of non-conductive samples without coating (ESEM)
• Wet samples and nanoparticle characterization (STEM/WET-STEM)
• Metals, alloys, ceramics, and composites
• Polymers, fibers, particles, and gels
• Biological tissues and plant materials
• Thin films/coatings, glass, and pharmaceutical forms
Highlights
• Broad sample compatibility via high vacuum, low vacuum, and ESEM modes (including uncoated insulators)
• STEM and WET-STEM capability for nanoparticle characterization and wet-sample workflows
• ColorSEM technology for colorized imaging and an integrated optical camera for navigation
Technical Specifications
| Feature | Value / Description |
|---|---|
| Magnification | 1,000,000× |
| Image resolution (pixels) | 768×512 – 6144×4096 |
| Resolution (STEM) | 0.8 nm @ 30 kV |
| Resolution (SE, High vacuum) | 1.0 nm @ 30 kV |
| Resolution (SE, Low vacuum) | 1.3 nm @ 30 kV |
| Resolution (ESEM mode, SE) | 3.0 nm @ 1 kV |
| Accelerating voltage | 200 V – 30 kV |
| Particle size analysis | ≥ 1 nm |
| Tilt angle | –15° to +90° |
| Peltier-cooled stage | –20°C to +40°C |
| Navigation | Integrated optical camera |
| Color imaging | ColorSEM technology |
Contact / Service Request
For service requests: you may email [email protected]. (Please specify the sample type, purpose, and preferred date range.)